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(parent: 8c676b5) | patch
tests: Allow PIN generation failure during OOM in ap_wps_random_ap_pin
authorJouni Malinen <jouni@qca.qualcomm.com>
Fri, 19 Feb 2016 16:43:45 +0000 (18:43 +0200)
committerJouni Malinen <j@w1.fi>
Fri, 19 Feb 2016 16:44:39 +0000 (18:44 +0200)
commit20c48fd99b1458db6ab61d4ec46aed2a824b257f
tree9257d8495077ff3100d87d9b150410589d0dc69etree | snapshot
parent8c676b50562c5ef5124691d7df7b4f0e03eb042dcommit | diff
tests: Allow PIN generation failure during OOM in ap_wps_random_ap_pin

This is needed to avoid reporting failures after a change to remove the
fallback path in PIN generation.

Signed-off-by: Jouni Malinen <jouni@qca.qualcomm.com>
tests/hwsim/test_ap_wps.py diff | blob | history
Moonshot GSS-API mechanism